Development of a High-Resolution Low Energy Electron Diffraction System.
AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OH
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Spot Profile Analysis is an efficient process used to evaluate both qualitatively and quantitatively the defect structure of crystal surfaces. The process consists of analyzing the angular distribution of a Low Energy Electron Diffraction LEED spot. This paper describes the design, construction, and testing of a new LEED detection system which uses a position sensitive detector. The electron optics built for this system incorporate several unique design features. These features include unipotential lenses, and the use of an easily removable electron source. Preliminary testing of the system shows transfer widths in the 300 angstrom range for electron energies from 80 to 250 eV.
- Atomic and Molecular Physics and Spectroscopy