Applications of Scanning Tunneling Microscopy to Electrochemistry
CALIFORNIA INST OF TECH PASADENA DEPT OF CHEMISTRY
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The focus of research in the last year has been STM Scanning Tunneling Microscopy studies of electrode solution interfaces. STM, and its derivatives e.g. AFM, Atomic Force Microscopy are the only surface analytic methods capable of yielding real-space, atomic resolution, electronic and structural maps of immersed electrode surfaces. To achieve this goal, in the previous contract period we have developed STM tip preparation methodologies that enable atomic resolution imaging of electrode surfaces in solutions containing high 0.1 M concentrations of electron donar and acceptor species. These techniques have significantly extended the applicability of STM to electrochemical investigations. Recent STM investigations of electrochemical systems surface under varied media.
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