Dosimetry for Microelectronics.
Technical rept. 23 Sep 86-23 Feb 90,
MISSION RESEARCH CORP NASHUA NH
Pagination or Media Count:
Existing information on the dose enhancement effect is reviewed and current problems identified. Possible solutions are outlined. In addition, the design and use of a dual cavity ionization chamber for routine measurement of dose enhancement factors in cobalt-60 gamma test facilities is described. The enhancement factors can be derived directly from the chamber measurements without recourse to reference data that may be difficult to obtain. This relatively simple device reliably reproduced earlier results obtained by more involved equipment and procedures. Measured enhancement factors are reported for new material combinations not previously examined and compared with recent calculations.
- Electrical and Electronic Equipment