Accession Number:

ADA235601

Title:

Dosimetry for Microelectronics.

Descriptive Note:

Technical rept. 23 Sep 86-23 Feb 90,

Corporate Author:

MISSION RESEARCH CORP NASHUA NH

Personal Author(s):

Report Date:

1991-05-01

Pagination or Media Count:

97.0

Abstract:

Existing information on the dose enhancement effect is reviewed and current problems identified. Possible solutions are outlined. In addition, the design and use of a dual cavity ionization chamber for routine measurement of dose enhancement factors in cobalt-60 gamma test facilities is described. The enhancement factors can be derived directly from the chamber measurements without recourse to reference data that may be difficult to obtain. This relatively simple device reliably reproduced earlier results obtained by more involved equipment and procedures. Measured enhancement factors are reported for new material combinations not previously examined and compared with recent calculations.

Subject Categories:

  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE