Transmission Electron Microscopy of the CVD Diamond Film/Substrate Interface.
NATIONAL INST OF STANDARDS AND TECHNOLOGY GAITHERSBURG MD
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Progress has been made in understanding growth patterns of Thin Grain Diamond CVD FIlms. In the study which was performed by High Resolution Electron Microscopy attention was focused on the fault structure as a function of the position in the grain as well as on the formation of mismatch boundaries within the growing diamond crystal. It was found that these boundaries can serve as precise indicators for the local growth direction of the crystal and thus to lead back to the nucleation point in a given TEM cross section. In an example given in this report the local nucleation point is traced back to a 5-fold twin site.
- Inorganic Chemistry