X-Ray Diffraction and Electron Spectroscopy of Epitaxial Molecular C sub 60 Films
Technical rept. no. 11, Jun 1990-Feb 1991
CALIFORNIA UNIV LOS ANGELES
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Films of the new carbon allotrope, molecular C60, also known as Buckminsterfullerence, have been grown on Si111 substrates by molecular beam epitaxy. The films have been characterized with x-ray two-theta diffraction, x- ray photoelectron spectroscopy, Auger electron spectroscopy, and electron energy loss spectroscopy. The diffraction data from oriented films show that close- packed planes of C60 molecules are stacked parallel to the substrate surface, but that the correlation length for x-ray scattering is less than 200 angstroms. The electron spectroscopic data shows that the C atoms of C60 are essentially sp2-bonded, but there are significant differences with respect to graphite.
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