Accession Number:

ADA232152

Title:

X-Ray Diffraction and Electron Spectroscopy of Epitaxial Molecular C sub 60 Films

Descriptive Note:

Technical rept. no. 11, Jun 1990-Feb 1991

Corporate Author:

CALIFORNIA UNIV LOS ANGELES

Report Date:

1991-02-28

Pagination or Media Count:

20.0

Abstract:

Films of the new carbon allotrope, molecular C60, also known as Buckminsterfullerence, have been grown on Si111 substrates by molecular beam epitaxy. The films have been characterized with x-ray two-theta diffraction, x- ray photoelectron spectroscopy, Auger electron spectroscopy, and electron energy loss spectroscopy. The diffraction data from oriented films show that close- packed planes of C60 molecules are stacked parallel to the substrate surface, but that the correlation length for x-ray scattering is less than 200 angstroms. The electron spectroscopic data shows that the C atoms of C60 are essentially sp2-bonded, but there are significant differences with respect to graphite.

Subject Categories:

  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE