Scattering from Thin Apertures in Coated Conductors Using FDTD
KANSAS UNIV CENTER FOR RESEARCH INC LAWRENCE RADAR SYSTEMS AND REMOTE SENSING LAB
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The Finite-Difference Time-Domain FDTD technique is applied to scattering problems involving thin dielectric sheets, conductor-backed dielectric sheets and conductor-backed dielectric sheets containing cracks in the dielectric coating. The FDTD technique is first applied in a brute force method to solve the scattering problems. Then, coarse cells are used whereby the dimensions of the scatterer can be smaller than the dimensions of the FDTD unit cell. This approach, referred to as the thin equation approach, is computationally more efficient than the brute force method. Numerical results are shown in the frequency domain. Specifically, radar cross section RCS and near-field results obtained using a two-dimensional FDTD code are presented.
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