Short Pulse Test Set
FRANKLIN RESEARCH CENTER NORRISTOWN PA
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This report discusses the construction and operation of the Short Pulse Test Set that has been built for the U.S. Army Missile Command for the purpose of applying short 25 to 100 nanosecond, high voltage pulses to EEDs in both the pin-to-pin and pins-to-case mode. The test set employs the short pulse generating techniques first described in the Franklin Institute Research Laboratories now Franklin Research Center Report I-C3410, Pins-to-Case Short Pulse Sensitivity Studies for the Atlas DC Switch, December 1974. This report, authored by Ramie H. Thompson, was prepared for Picatinny Arsenal under contract DAAA21-72C-0766. The test set described herein utilizes a computer controlled high speed digitizer to monitor the pulse voltage and current and provides software to process and display these data.
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