Accession Number:

ADA230427

Title:

Determination of the Optical Properties of Organic Thin Films by Spectroscopic Ellipsometry

Descriptive Note:

Master's thesis

Corporate Author:

AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OH SCHOOL OF ENGINEERING

Personal Author(s):

Report Date:

1990-12-01

Pagination or Media Count:

97.0

Abstract:

This theses demonstrated the feasibility of determining the optical properties of organic and polymer thin films through the use of Spectroscopic Ellipsometry SE. Tan Psi and cos Delta data from 300-800 nanometers NM were taken with a Rudolph Research s2000 spectroscopic ellipsometer four samples indium tin oxide ITO coated glass five layer poly-benzyl-L glutamate PBLG organic film on ITO coated glass eight layer PBLG film on ITO coated glass and a thiophene polymer film on a microscope slide. The data sets were fit to a choice of four computer models based on a paper written by Dwight Berreman in 1972. The four were written in MATLAB to take advantage of its matrix manipulative capabilities. The models were a single layer isotropic film on an isotropic substrate a single layer anisotropic film on an isotropic substrate two isotropic films on an isotropic substrate and two anisotropic films on an isotropic substrate. Using only tan Psi data over a restricted wavelength region, all four data sets were fit to variances of 0.01 or less. JHD

Subject Categories:

  • Polymer Chemistry
  • Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE