Accession Number:

ADA222277

Title:

Research with Scanning Tip Microscopes

Descriptive Note:

Final rept. 1 Dec 1988-30 Nov 1989,

Corporate Author:

ARIZONA UNIV TUCSON OPTICAL SCIENCES CENTER

Personal Author(s):

Report Date:

1990-04-17

Pagination or Media Count:

6.0

Abstract:

An atomic force microscope has been developed using a laser diode as the interferometer which senses the minute deflection of the force sensing tip. The system, which has been incorporated inside a commercial instrument Digital Instruments is capable of detecting atomic steps on graphite. The instrument is also being used to profile magnetic and electric fields on storage media and integrated circuit chips, respectively. JG

Subject Categories:

  • Optics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE