Accession Number:

ADA222242

Title:

Background Effects in ESDIAD Measurements on Si(111)-(7x7)

Descriptive Note:

Technical rept.

Corporate Author:

PITTSBURGH UNIV PA SURFACE SCIENCE CENTER

Report Date:

1990-05-21

Pagination or Media Count:

21.0

Abstract:

The background effect in electron stimulated desorption ion angular distribution ESDIAD measurements due to soft x-ray production on Si111-7x7 is investigated. We find that the background intensity from a Si111-7x7 surface varies linearly with incident electron beam energy and current density. It is also found that the elimination of the background effect by subtraction plays a crucial role in both quantitative and qualitative interpretations of digital ESDIAD measurements on silicon, as well as to similar measurements on other surfaces. jes

Subject Categories:

  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE