Accession Number:

ADA214308

Title:

Observation of Atomic Relaxation Near an Interface through Detection of Emitted Fluorescence

Descriptive Note:

Technical rept.

Corporate Author:

STATE UNIV OF NEW YORK AT BUFFALO DEPT OF CHEMISTRY

Personal Author(s):

Report Date:

1989-11-01

Pagination or Media Count:

20.0

Abstract:

In this Comment we discuss the general features of spontaneous decay of an atom which is close to the surface of a dielectric or metal layer, and this is compared to atomic decay near a four-wave mixing phase conjugator. It is pointed out that the decay or relaxation constants can be expressed entirely in terms of the classical Fresnel coefficients for reflection and transmission of a plane wave, independent of what the explicit forms of these coefficients are. For decay near a dielectric the relaxation constants can be measured directly by counting the number of fluorescent photons per unit of time, after excitation by a laser. For relaxation near a phase conjugator this procedure would require a spectral resolution in the photon detection, since there are two distinct contributions to the fluorescent yield of a two-state atom. The two possible decay mechanisms have different relaxation constants and produce radiation with different frequencies. Atomic relaxation, Near an interface, Emitted fluorescence, Classical fresnel coefficients, Phase conjugator, Four-wave mixing. jes

Subject Categories:

  • Atomic and Molecular Physics and Spectroscopy

Distribution Statement:

APPROVED FOR PUBLIC RELEASE