Accession Number:

ADA210655

Title:

Precision Materials Characterization in the Near Millimeter and Submillimeter Wavelength Range

Descriptive Note:

Final rept. 1 Oct 1984-31 Dec 1988

Corporate Author:

NORTH CAROLINA CENTRAL UNIV DURHAM DEPT OF PHYSICS

Personal Author(s):

• Dutta, Jyotsna M.
• Jones, Charles R.

Report Date:

1989-06-01

Pagination or Media Count:

22.0

Abstract:

Laser-based instrumentation which employs quasi-optical techniques to measure near millimeter wave dielectric properties has been developed in this laboratory and successfully used to acquire a data base on a wide variety of materials. This report includes the results for various crystalline and non- crystalline solids, semiconductor, and samples of various standard and advanced ceramics. Measurements are at 245 GHz and the results are compared with the data obtained by other researchers on similar samples. Near millimeter waves Optically pumped molecular laser Crystal sapphire Alumina Quartz and fused silica Silicon Boron nitride Silicon nitrides Beryllia nickel ferrites.

Descriptors:

• *DIELECTRIC PROPERTIES
• *CRYSTALS
• *CERAMIC MATERIALS
• *SEMICONDUCTORS
• *LASER APPLICATIONS
• FUSED SILICA
• QUARTZ
• ALUMINUM OXIDES
• SILICON
• PRECISION
• INSTRUMENTATION
• SUBMILLIMETER WAVES
• NEAR FIELD
• FERRITES
• SILICON NITRIDES
• BERYLLIUM OXIDES
• BORON NITRIDES
• OPTICAL PUMPING
• MOLECULAR LASERS
• SAPPHIRE
• MILLIMETER WAVES
• MATERIALS
• NICKEL COMPOUNDS
• DATA BASES
• FREQUENCY

Subject Categories:

• Lasers and Masers
• Ceramics, Refractories and Glass
• Test Facilities, Equipment and Methods
• Crystallography
• Electricity and Magnetism
• Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE