Accession Number:

ADA210314

Title:

Attenuated Total Reflection FTIR Spectroscopy for Measuring Interfacial Reaction Kinetics at Silica Surfaces

Descriptive Note:

Technical rept. no. 16, Jul 1988-Jul 1989

Corporate Author:

UTAH UNIV SALT LAKE CITY DEPT OF CHEMISTRY

Personal Author(s):

• Parry, D. B.
• Harris, J. M.

Report Date:

1989-07-01

Pagination or Media Count:

12.0

Abstract:

Attenuated total reflection ATR spectroscopy has been adapted to measure the rates of chemical reactions which modify silica surfaces. In this method, a silicon ATR substrate is oxidized to produce a silicon dioxide surface layer, which can be used as a model silica surface in measurements of the rates chemical modification. An ATR flow cell is filled with a solution of a surface active reagent, and spectra are obtained at regular intervals. Confinement of the infrared intensity to the interface by total internal reflection provides a measure of changes in concentrations of species which adsorb or bind to the surface.

Descriptors:

• *ADSORPTION
• *MOLECULAR SPECTROSCOPY
• *MODIFICATION
• *INTERNAL REFLECTION
• LAYERS
• SILICON DIOXIDE
• CELLS
• INTENSITY
• RATES
• SUBSTRATES
• SURFACES
• SILICON
• CHEMICAL REACTIONS
• SURFACE ACTIVE SUBSTANCES
• CONFINEMENT(GENERAL)
• FLOW
• ABSORPTION SPECTRA
• INFRARED RADIATION
• INTERFACES
• CHEMICAL PROPERTIES
• REACTION KINETICS
• MEASUREMENT
• MODELS

Subject Categories:

• Test Facilities, Equipment and Methods
• Atomic and Molecular Physics and Spectroscopy

Distribution Statement:

APPROVED FOR PUBLIC RELEASE