Accession Number:

ADA199350

Title:

Fault Model Development for Fault Tolerant VLSI Design

Descriptive Note:

Final technical rept. May 1986-May 1987

Corporate Author:

SYRACUSE UNIV NY SCHOOL OF COMPUTER AND INFORMATION SCIENCE

Report Date:

1988-05-01

Pagination or Media Count:

136.0

Abstract:

Fault models provide systematic and precise representations of physical defects in microcircuits in a form suitable for simulation and test generation. The current difficulty in testing VLSI circuits can be attributed to the tremendous increase in design complexity and the inappropriateness of traditional stuck-at fault models. This report develops fault models for three different types of common defects that are not accurately represented by the stuck-at fault model. The faults examined in this report are bridging faults, transistor stuck-open faults, and transient faults caused by alpha particle radiation. A generalized fault model could not be developed for the three fault types. However, microcircuit behavior and fault detection strategies are described for the bridging, transistor stuck-open, and transient alpha particle strike faults. The results of this study can be applied to the simulation and analysis of faults in fault tolerant VLSI circuits.

Subject Categories:

  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE