Accession Number:
ADA199350
Title:
Fault Model Development for Fault Tolerant VLSI Design
Descriptive Note:
Final technical rept. May 1986-May 1987
Corporate Author:
SYRACUSE UNIV NY SCHOOL OF COMPUTER AND INFORMATION SCIENCE
Personal Author(s):
Report Date:
1988-05-01
Pagination or Media Count:
136.0
Abstract:
Fault models provide systematic and precise representations of physical defects in microcircuits in a form suitable for simulation and test generation. The current difficulty in testing VLSI circuits can be attributed to the tremendous increase in design complexity and the inappropriateness of traditional stuck-at fault models. This report develops fault models for three different types of common defects that are not accurately represented by the stuck-at fault model. The faults examined in this report are bridging faults, transistor stuck-open faults, and transient faults caused by alpha particle radiation. A generalized fault model could not be developed for the three fault types. However, microcircuit behavior and fault detection strategies are described for the bridging, transistor stuck-open, and transient alpha particle strike faults. The results of this study can be applied to the simulation and analysis of faults in fault tolerant VLSI circuits.
Descriptors:
Subject Categories:
- Electrical and Electronic Equipment