The Measurement of Residual Stress in Uranium Using Energy Dispersive X- Ray Diffraction
Final technical rept. 1 Sep 1986-30 Jun 1988
KING'S COLL LONDON (UNITED KINGDOM) WHEATSTONE PHYSICS LAB
Pagination or Media Count:
Energy dispersive X ray diffraction using synchrotron radiation was used to perform residual stress measurements on a bar of uranium. The basic theory of energy dispersive diffraction is presented, and the features most relevant to the work reported here are discussed. Residual stress measurements were made using the sin squared psi method which is described in detail. Despite using the higher energy radiation produced by the 5 Tesla wiggler of the UK synchrotron Radiation Source SRS, the penetration was insufficient to measure inside the bulk of material. Our results therefore apply to a thin surface layer which is a mixture of uranium and uranium oxide. Within this surface, we found a residual compressive stress of 1097 MPa. The accuracy of our measurements was limited by the in ability to use transmission geometry as a result of the high absorption. In energy dispersive diffraction, reflection geometry in high energy radiation requires low angles of diffraction which limit the range over which the sample can be tilted to perform stress measurements. These points are discussed in some detail in our conclusion where suggestions for future work are made. Keywords Energy dispersive, X ray diffraction, Synchrotron radiation, Wiggler, Residual stress, Uranium, Great Britain.
- Inorganic Chemistry
- Metallurgy and Metallography
- Nuclear Physics and Elementary Particle Physics