Accession Number:

ADA196770

Title:

Atomic Force MIcroscopy and Scanning Tunneling Microscopy with a Combination Atomic Force Microscope/Scanning Tunneling Microscopy

Descriptive Note:

Technical rept.

Corporate Author:

CALIFORNIA UNIV SANTA BARBARA DEPT OF PHYSICS

Report Date:

1988-06-01

Pagination or Media Count:

6.0

Abstract:

Since almost all the electronic and mechanical requirements for an atomic force microscope AFM are the same as for a scanning tunneling STM, it is convenient and practical to build a combination AFMSTM with interchangeable heads. The conversion from one to the other can be made in a few minutes. Representative images demonstrate that atomic resolution can be obtained in both modes of operation. With the two modes of operation, it can image conductors, semiconductors, and insulators.

Subject Categories:

  • Physical Chemistry
  • Electrical and Electronic Equipment
  • Test Facilities, Equipment and Methods
  • Atomic and Molecular Physics and Spectroscopy

Distribution Statement:

APPROVED FOR PUBLIC RELEASE