Atomic Force MIcroscopy and Scanning Tunneling Microscopy with a Combination Atomic Force Microscope/Scanning Tunneling Microscopy
CALIFORNIA UNIV SANTA BARBARA DEPT OF PHYSICS
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Since almost all the electronic and mechanical requirements for an atomic force microscope AFM are the same as for a scanning tunneling STM, it is convenient and practical to build a combination AFMSTM with interchangeable heads. The conversion from one to the other can be made in a few minutes. Representative images demonstrate that atomic resolution can be obtained in both modes of operation. With the two modes of operation, it can image conductors, semiconductors, and insulators.
- Physical Chemistry
- Electrical and Electronic Equipment
- Test Facilities, Equipment and Methods
- Atomic and Molecular Physics and Spectroscopy