Accession Number:

ADA191618

Title:

Defects in High-Mobility Semiconductor Systems.

Descriptive Note:

Interim rept. no. 1,

Corporate Author:

LUND UNIV (SWEDEN) DEPT OF SOLID STATE PHYSICS

Personal Author(s):

• Grimmeiss, Hermann

Report Date:

1987-10-23

Pagination or Media Count:

2.0

Abstract:

Initial work under subject contract was devoted to a assembling and calibrating essential electrical, optical, and spectroscopic measurement facilities needed for analysis of defects in high-mobility structures b application of such measurement systems to study of basic defects in previously characterized materials, in order to validate techniques and also to verify and extend our understanding of the physics of such basic defects and c initiation of fabrication of critical test samples comprising heterostructures and superlattices of GaAs and Si and Ge.

Descriptors:

• *ELECTRON MOBILITY
• DEFECTS(MATERIALS)
• FACILITIES
• MEASUREMENT
• SAMPLING
• SPECTROSCOPY
• STRUCTURES
• CRYSTAL DEFECTS
• SOLID STATE PHYSICS
• GALLIUM ARSENIDES
• SILICON
• GERMANIUM

Subject Categories:

• Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE