Accession Number:

ADA191379

Title:

Instrumentation for Ultrafast Electronics.

Descriptive Note:

Final rept. 1 Oct 86-30 Sep 87,

Corporate Author:

STANFORD UNIV CA EDWARD L GINZTON LAB OF PHYSICS

Personal Author(s):

• Bloom, D. M.

Report Date:

1987-11-30

Pagination or Media Count:

122.0

Abstract:

Increasing numbers of III-V compound semiconductor devices and circuits operate in a regime where internal node testing with traditional electronic means proves impossible due to circuit loading and limited time resolution. Electrooptic sampling employs picosecond infrared laser pulses to non-invasively examine internal node voltages with 100 GHz bandwidth. Under this grant, a very low phase noise synthesizer was purchased to provide stable drive to the laser mode-locker, and a microwave synthesizer was purchased to drive the device under test up to 40 GHz. In addition, a computer aided design graphics workstation was purchased to permit the design of novel ultrafast devices. In-house design, fabrication, and detailed diagnostic testing of ultrafast III-V integrated circuits are now all possible at this unique facility.

Descriptors:

• *CIRCUITS
• *ELECTRONICS
• *ELECTROOPTICS
• *GROUP III COMPOUNDS
• *GROUP V COMPOUNDS
• *INFRARED LASERS
• *INFRARED PULSES
• *INTEGRATED CIRCUITS
• *SAMPLING
• DIAGNOSIS(GENERAL)
• DRIVES
• FREQUENCY SYNTHESIZERS
• HIGH RATE
• INTERNAL
• MICROWAVE EQUIPMENT
• NODES
• NUMBERS
• RESOLUTION
• STABILITY
• TEST AND EVALUATION
• TIME
• VOLTAGE

Subject Categories:

• Electrical and Electronic Equipment
• Solid State Physics
• Optics
• Lasers and Masers
• Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE