Instrumentation for Ultrafast Electronics.
Final rept. 1 Oct 86-30 Sep 87,
STANFORD UNIV CA EDWARD L GINZTON LAB OF PHYSICS
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Increasing numbers of III-V compound semiconductor devices and circuits operate in a regime where internal node testing with traditional electronic means proves impossible due to circuit loading and limited time resolution. Electrooptic sampling employs picosecond infrared laser pulses to non-invasively examine internal node voltages with 100 GHz bandwidth. Under this grant, a very low phase noise synthesizer was purchased to provide stable drive to the laser mode-locker, and a microwave synthesizer was purchased to drive the device under test up to 40 GHz. In addition, a computer aided design graphics workstation was purchased to permit the design of novel ultrafast devices. In-house design, fabrication, and detailed diagnostic testing of ultrafast III-V integrated circuits are now all possible at this unique facility.
- Electrical and Electronic Equipment
- Solid State Physics
- Lasers and Masers
- Test Facilities, Equipment and Methods