Accession Number:

ADA191246

Title:

Compilation of Preprints.

Descriptive Note:

Technical rept.

Corporate Author:

STANFORD UNIV CA CENTER FOR RELIABLE COMPUTING

Personal Author(s):

Report Date:

1987-06-01

Pagination or Media Count:

28.0

Abstract:

Contents Circuit Segmentation for Pseudo-Exhaustive Testing Via Simulated Annealing Probability Models for Pseudorandom Test Sequence and Built-In Self-Tewt for Sequential Machines. Keywords Heuristic approximation algorithm Combinatorial circuits Circuit testers.

Descriptors:

• *CIRCUIT TESTERS
• ALGORITHMS
• ANNEALING
• CIRCUITS
• HEURISTIC METHODS
• MACHINES
• PROBABILITY
• PSEUDO RANDOM SEQUENCES
• SEGMENTED
• SEQUENCES
• SIMULATION

Subject Categories:

• Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE