DID YOU KNOW? DTIC has over 3.5 million final reports on DoD funded research, development, test, and evaluation activities available to our registered users. Click
HERE to register or log in.
Accession Number:
ADA191240
Title:
Thin Film Research Diagnostics Instrumentation.
Descriptive Note:
Final rept. 1 Jan 85-30 Jun 86,
Corporate Author:
NEW MEXICO UNIV ALBUQUERQUE
Report Date:
1987-10-21
Pagination or Media Count:
3.0
Abstract:
All equipment purchased under this contract has been used for deposition and analysis of thin films. In particular, the Ar-ion laser is being used to investigate film scatter at multiple wavelengths. The excimer laser is being used to enhance deposition mechanisms it illuminates a coated surface throughout film disposition. The microscope and ellipsometer are part of diagnostics used to analyze films.
Distribution Statement:
APPROVED FOR PUBLIC RELEASE