Thin Film Research Diagnostics Instrumentation.
Final rept. 1 Jan 85-30 Jun 86,
NEW MEXICO UNIV ALBUQUERQUE
Pagination or Media Count:
All equipment purchased under this contract has been used for deposition and analysis of thin films. In particular, the Ar-ion laser is being used to investigate film scatter at multiple wavelengths. The excimer laser is being used to enhance deposition mechanisms it illuminates a coated surface throughout film disposition. The microscope and ellipsometer are part of diagnostics used to analyze films.
- Inorganic Chemistry