Accession Number:

ADA191015

Title:

Interface Characterization of Cu-Cu and Cu-Ag-Cu Low Temperature Solid State Bonds.

Descriptive Note:

Master's thesis,

Corporate Author:

NAVAL POSTGRADUATE SCHOOL MONTEREY CA

Personal Author(s):

Report Date:

1987-12-01

Pagination or Media Count:

53.0

Abstract:

In this study, Auger Electron Spectroscopy AES, Scanning Electron Microscopy SEM and Energy Dispersive X ray EDX analysis have been used to characterize the interface regions of copper to silver and copper to copper bond samples in an effort to identify those parameters which most affect the bond characteristics. Longitudinal and transverse cross sections of the bond joint are examined. Auger electron sputter depth profiling was used to examine the interface properties and composition across the bond interface. Depth profiles indicate carbon and oxygen diffuse away from the interface during bonding facilitating adhesion. Tensile tests on bonded samples indicate that bond pressure has a more significant effect on bond strength than temperature. A temperature threshold for bonding is observed which is related to the ability of the bond materials to scavenge their oxides. Keywords Interface characterization, Auger spectroscopy, Solid state bonding, Diffusion bonding, Scanning electron microscopy.

Subject Categories:

  • Metallurgy and Metallography
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE