Accession Number:

ADA184906

Title:

Electromagnetics and Electrothermal Approach to Evaluate Failures in Microelectronic Devices Caused by Electrostatic Discharges: Stochastical Aspects of the Device Reliability.

Descriptive Note:

Final rept. for 1984-1987,

Corporate Author:

RIT RESEARCH CORP ROCHESTER NY

Personal Author(s):

Report Date:

1987-08-01

Pagination or Media Count:

364.0

Abstract:

This report summarizes the following research efforts addressed in the project Interaction of electromagnetic overstresses, such as electrostatic discharge ESD with the microelectronic devices, resulting IC damages and methods of preventing the related failures.

Subject Categories:

  • Electricity and Magnetism

Distribution Statement:

APPROVED FOR PUBLIC RELEASE