Electromagnetics and Electrothermal Approach to Evaluate Failures in Microelectronic Devices Caused by Electrostatic Discharges: Stochastical Aspects of the Device Reliability.
Final rept. for 1984-1987,
RIT RESEARCH CORP ROCHESTER NY
Pagination or Media Count:
This report summarizes the following research efforts addressed in the project Interaction of electromagnetic overstresses, such as electrostatic discharge ESD with the microelectronic devices, resulting IC damages and methods of preventing the related failures.
- Electricity and Magnetism