Accession Number:

ADA183211

Title:

An XPS (X-Ray Photoelectron Spectroscopy) Study of the Composition of Thin Polyimide Films Formed by Vapor Deposition.

Descriptive Note:

Technical rept.,

Corporate Author:

CAMBRIDGE UNIV (ENGLAND) CAVENDISH LAB

Personal Author(s):

• Lamb,R. N.
• Baxter,J.
• Grunze,M.
• Kong,C. W.
• Unertl,W. N.

Report Date:

1987-07-15

Pagination or Media Count:

35.0

Abstract:

Films of polyimide 8nm were formed on a polycrystalline silver surface following heating of a vapor deposited layer of 4,4 oxydianiline ODA and 1,2,4,5 Benzenetetracarboxylic anhydride 4 PMDA. The imidization reaction leading to polymer formation was followed in situ with X-ray Photoelectron Spectroscopy. The uncertainties inherent in a quantitative analysis of the composition of the top 8 nm surface layer corresponding to the sampling depth of the technique are discussed with respect to thick films of OFA and PMDA adsorbed on a clean copper 111 surface at 200 K. The fully cured polyimide film contains excess ODA-like and PMDA-like constituents as trapped molecules or terminal groups.

Descriptors:

• *VAPOR DEPOSITION
• *FILMS
• *POLYIMIDE RESINS
• COPPER
• QUANTITATIVE ANALYSIS
• LAYERS
• SURFACES
• THIN FILMS
• X RAY PHOTOELECTRON SPECTROSCOPY
• POLYMERS
• DEPTH
• SAMPLING
• THICK FILMS
• MOLECULES
• TRAPPING(CHARGED PARTICLES)

Subject Categories:

• Organic Chemistry

Distribution Statement:

APPROVED FOR PUBLIC RELEASE