X-Ray Topography Utilizing Non-Equatorial Reflections.
Final technical rept. 25 Sep 84-6 Jun 85,
ARMY BALLISTIC RESEARCH LAB ABERDEEN PROVING GROUND MD
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The principal thrust of X-ray topography has been toward the study of general dislocation arrangements in quite perfect crystals. Since the early work of Barrett and Honeycombe there has been relatively little interest in deformation structures at least inpart because of the difficulty of extracting useful quantitative information about the geometry from topographs. This paper describes the general geometry of back reflection topography and shows how a systematic exploitation of the back reflection geometry can be used to maximize the information which can be obtained and optimizes the diffraction geometry for any given Bragg reflection. A camera design based upon this general approach is described, as well some specific procedures for its utilization. The basic approach to back reflection topography can be applied to any topographic arrangement. Since the present camera was intended for the study of macrostructures of crystals with high dislocation densities, it was designed to image large sample areas at low resolution. The basic analysis and procedures apply equally well, however, to any back reflection technique. The possibility of effectively non-equatorial reflections greatly enhances the power and flexibility of the method.
- Solid State Physics