Metal Oxide Varistor Burn-in.
Final rept. Aug-Nov 85,
AIR FORCE WEAPONS LAB KIRTLAND AFB NM
Pagination or Media Count:
Varistor degradation from unipolar transient pulsing is described. Metal-Oxide varistors MOVs subjected to a single high-energy transient displayed an increase in standby current and a decrease in clamping voltage. The amount of degradation was dependent on the polarity of the measurement relative to the polarity of the pulsing, as well as the energy rating of the device. After one pulse, the clamping voltage is lower when measured at the port opposite to the pulsing than when measured at the same port which was pulsed. Polarization of permanent electric dipoles in the insulating intergranular matrix and the filling of traps at the metal oxide grain boundaries are discussed as possible mechanisms for the degradation. Author
- Electrical and Electronic Equipment
- Solid State Physics