Accession Number:

ADA170299

Title:

Stable Crack Growth in Aluminum Tensile Specimens.

Descriptive Note:

Technical rept.,

Corporate Author:

WASHINGTON UNIV SEATTLE DEPT OF MECHANICAL ENGINEERING

Personal Author(s):

Report Date:

1986-07-01

Pagination or Media Count:

41.0

Abstract:

Posts white light moire interferometry was used to obtain sequential records of the transient u sub y-displacement fields associated with stable crack growth in 7075-T6 and 2024-O, single edge notched SEN specimens with fatigued cracks. The u sub y-displacement fields were used to evaluate the crack tip opening displacement CTOD, far and near-field J-integral values, Dugdale strip yield model, Williams polynomial function and the HRR fields.

Subject Categories:

  • Metallurgy and Metallography
  • Mechanics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE