Stable Crack Growth in Aluminum Tensile Specimens.
WASHINGTON UNIV SEATTLE DEPT OF MECHANICAL ENGINEERING
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Posts white light moire interferometry was used to obtain sequential records of the transient u sub y-displacement fields associated with stable crack growth in 7075-T6 and 2024-O, single edge notched SEN specimens with fatigued cracks. The u sub y-displacement fields were used to evaluate the crack tip opening displacement CTOD, far and near-field J-integral values, Dugdale strip yield model, Williams polynomial function and the HRR fields.
- Metallurgy and Metallography