Accession Number:

ADA164382

Title:

Materials Research Society Symposia Proceedings. Volume 46. Microscopic Identification of Electronic Defects in Semiconductors Held at San Francisco, California on 15-18 April 1985,

Descriptive Note:

Final rept. 1 Apr 85-31 Mar 86,

Corporate Author:

MATERIALS RESEARCH SOCIETY PITTSBURGH PA

Report Date:

1985-01-01

Pagination or Media Count:

621.0

Abstract:

Partial Contents Defect Structure and Properties by Junction Spectroscopy Microscopic Identification of Defects in Semiconductors by Electron-Spin-Resonance and Related Techniques Identification of Impurities and Defects in Semiconductors by Optical Spectroscopy Electronic Defect Characterization The Role of Theory in Defect Physics Physics of Deep Levels Thermodynamics of Deep Levels in Semiconductors El2 and Related Defects in GaAs--Challenges and Pitfalls the IDentification of Lattice Defects in GaAs and AlGaAs Microscopic Identification of Anion Antisite Defects in GaAs by Optically Detected Magnetic Resonance Defect Identification in Silicon Using Electron Nuclear Double Resonance Defect Aggregates in Silicon Electron Paramagnetic Resonance of Intrinsic Defects in III-V Semiconductors Characterization of Semiconductors and Semiconducting Superlattices using High-Resolution Photolumienscence Spectroscopy Role of Electron Microscopy in Semiconductor Electronic Defect Analysis Local Vibrational Mode Spectroscopy of Impurities in Semiconductors Defect Indentification in High-Purity Semiconductors and Microscopic Identification of Optical Defects in Silicon by Photoluminescence.

Subject Categories:

  • Crystallography
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE