Investigations into the Origins of the Physical Structure of Thin Films.
Annual rept. 1 Jul 84-30 Jun 85,
PENNSYLVANIA STATE UNIV UNIVERSITY PARK MATERIALS RESEARCH LAB
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The random ballistic aggregation of atoms onto a surface under low adatom mobility conditions leads to clustering and evolution of growth cones from these random clusters. The connections between these basic physical processes and the resulting wide variety of thin film morphologies both top surface and cross-section are being made in an attempt to quantify morphology, nad ultimately properties. The research can be divided into four research thrust areas 1. controlled film preparation 2. morphological characterization of the resulting films 3. image enhancementquantification of micrographs of morphology and 4. conceptual and computer modeling of the morphology. This report describes our progress in each of these areas. Originators supplied keywords include Sputtering Ion-assisted deposition and Fratals.
- Physical Chemistry