Accession Number:

ADA159395

Title:

Stress Level Testing of Electronics, Avionics Communications and C3I Equipments.

Descriptive Note:

Final rept.

Corporate Author:

ARMY TEST AND EVALUATION COMMAND ABERDEEN PROVING GROUND MD

Personal Author(s):

Report Date:

1985-08-30

Pagination or Media Count:

28.0

Abstract:

This Test Operations Procedure TOP describes test methods and techniques for measuring and evaluating the technical performance of a System Under Test SUT when the SUT is operated to and beyond specifications in order to determine its response to high levels of stimuli. The extremely short period allowed for the writing of this TOP along with the great diversity of potential systems to be tested has precluded the writing of a document which conclusively covers the topic of stress level testing. This document should b considered as a TOP which outlines the basic requirements and the basic test methodology for conducting stress level testing. This TOP includes only the electronics aspect of stress level testing. It does not consider the classical environmental and mechanical stress testing of materials these types of stress testing are covered in MIL-STD-810D. Keywords include Stress Loading, Simulating and Modeling Functions, Complex Electromagnetic Environment, Repeatable RF Stimuli, Real Time Operation, Direct coupled RF, Close Coupled RF, Digital Techniques, Low Powered Techniques, Scenario Driven, Stress Tests, Avionics, Communication, Electronics, and C3I.

Subject Categories:

  • Electrical and Electronic Equipment
  • Non-Radio Communications

Distribution Statement:

APPROVED FOR PUBLIC RELEASE