Accession Number:

ADA158843

Title:

Impact of Nonoperating Periods on Equipment Reliability

Descriptive Note:

Final rept. Feb 1983-Sep 1984,

Corporate Author:

IIT RESEARCH INST ROME NY

Personal Author(s):

• Coit, David W.
• Priore, Mary G.

Report Date:

1985-05-01

Pagination or Media Count:

441.0

Abstract:

The objective of this study was to develop a procedure to predict the quantitative effects of nonoperating periods on electronic equipment reliability. A series of nonoperating failure rate prediction models were developed at the component level. The models are capable of evaluating component nonoperating failure rate for any anticipated environment with the exception of a satellite environment. The proposed nonoperating failure rate prediction methodology is intended to provide the ability to predict the component nonoperating failure rate and reliability as a function of the characteristics of the devices, technology employed in producing the device, and external factors such as environmental stresses which have a significant effect on device nonoperating reliability. The prediction methodology is presented in a form compatible with MIL-HDBK-217 as an Appendix to the technical report. Additional keywords Dormancy Power on off cycling TablesData Data acquisition Mathematical models Microcircuits Discrete semiconductors Resistors Capacitors Inductive devices Lasers Tubes Mechanicalelectromechanical devices and Circuit interconnectors.

Descriptors:

• *ELECTRONIC EQUIPMENT
• *RELIABILITY
• *FAILURE(ELECTRONICS)
• STRESSES
• MATHEMATICAL MODELS
• METHODOLOGY
• ENVIRONMENTS
• PREDICTIONS
• MODELS
• RATES
• SEMICONDUCTORS
• LASERS
• CYCLES
• DATA ACQUISITION
• CIRCUIT INTERCONNECTIONS
• DISCRETE DISTRIBUTION
• TABLES(DATA)
• EXTERNAL
• CIRCUITS
• MICROCIRCUITS
• MECHANICAL COMPONENTS
• RESISTORS
• CAPACITORS

Subject Categories:

• Manufacturing and Industrial Engineering and Control of Production Systems
• Electricity and Magnetism

Distribution Statement:

APPROVED FOR PUBLIC RELEASE