Precision Interferometric Dilatometer
AEROSPACE CORP EL SEGUNDO CA MATERIALS SCIENCES LAB
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An improved double Michelson laser interferometric dilatometer with an inexpensive automatic signal processor is described. The unit is suitable for studying materials having near-zero coefficients of thermal expansion CTE ranging from 100 to 450 K. Delta LL values to a resolution of less than 10 to the minus 7th power and instantaneous CTE values to less than 10 to the minus 8th power per K can be plotted in real time at regular intervals 30 s to give time-related absolute expansion data of noncontacted samples of arbitrary shape or size. Keywords Dilatometry Michelson interferometry Signal processing Thermal expansion.
- Test Facilities, Equipment and Methods