Design of a Microprogram Control Unit with Concurrent Error Detection.
ILLINOIS UNIV AT URBANA COORDINATED SCIENCE LAB
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This paper presents an integrated approach to the design of a microprogram control unit MCU with concurrent error detection CED capability for errors generated by VLSI physical failures. The paper first presents the design of a single-chip MCU that comprehensively detects errors due to internal physical failures during its normal operation. The AM2910 microprogram sequencer is used as a functional model for the CED MCU. Lastly, the paper presents a critical evaluation of the actual mask-level layout of the CED MCU design versus a simplex MCU without CED and a CED MCU through duplication and comparison. Additional keywords Fault tolerant computing Control systems Integrated circuits Bus conductors. Author
- Computer Programming and Software