Transient Error Data Analysis.
CARNEGIE-MELLON UNIV PITTSBURGH PA DEPT OF COMPUTER SCIENCE
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Experimental data on transient faults from several digital computer systems are presented and analyzed. This research is significant because earlier work on validation of reliability models has concentrated only on permanent faults. The systems for which data have been collected are the DEC PDP-10 series computers, the Cm multiprocessor, and the C.vmp fault tolerant microprocessor. Current results show that transient faults do not occur with constant failure rates as has been commonly assumed. Instead, the data for all three systems indicate Weibull distributions with decreasing failure rates. Additional keywords data acquisition Weibull density functions charts goodness of fit test chi square method. Author
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