Degradation Mechanisms in Ceramic Dielectrics.
Interim rept. no. 2, 1 May 83-31 Jul 84,
LEHIGH UNIV BETHLEHEM PA MATERIALS RESEARCH CENTER
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This program is designed to identify the mechanisms that lead to leakage current degradation in BaTiO3-based dielectrics subjected to voltage-temperature stress, and to determine those factors that contribute to stability against such degradation. During the first year, it was confirmed that BaO-rich and donor-doped compositions are particularly stable, and that grain-size is a relatively unimportant parameter. During the second year of investigation, the microstructures of a BaO-rich and donor-doped BaTiO3 have been examined in detail in an effort to determine the reasons for their pronounced stability. In addition, the effect of porosity, both in amount and morphology, has been found to be an important factor. Authors keywords Dielectric degradation, Capacitor reliability, Ceramic capacitors.
- Electrical and Electronic Equipment