A Computer System for Generating Single and Double Sampling Plans for Attributes Data.
FLORIDA UNIV GAINESVILLE DEPT OF INDUSTRIAL AND SYSTEMS ENGINEERING
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This study brings together the programs developed in three previous reports into a unified sampling system. One segment contains the single and double sampling plans of MIL-STD-105D along with subroutines that evaluate the normal, tightened and reduced plans including switching rules. Output includes system OC curves, and Average Sample Number ASN, AOQ, and Average Fraction Inspected AFI, curves in either graphical or tabular form. Another segment derives single and double sampling plans to satisfy two points designated on the OC curve. An algorithm is employed which seeks to minimize the ASN at a designated Acceptable Quality Level AQL. The third segment is designed for use when rectifying inspection is employed. It derives single and double sampling plans based on one point on the OC curve, either the process average or a specified AQL value, intended to not exceed a specified Average Outgoing Quality Limit and minimizing the AFI at the process average or specified AQL. Programming is written in FORTRAN IV and development was on a VAX 11-750 computer. Author
- Computer Programming and Software