Surface Physics Instrumentation.
Final scientific rept. 15 Aug 83-14 Aug 84,
STEVENS INST OF TECH HOBOKEN NJ DEPT OF PHYSICS AND ENGINEERING PHYSICS
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A surface physics instrumentation system was assembled using components purchased from the DOD Instrumentation Grant in addition to components already present in the laboratory. The system consists of the following parts Ultrahigh vacuum vacuum system with sample insertion, Auger electron spectrometer, Ion scattering spectrometer, Secondary ion mass spectrometer and work function measuring system. The instrument is a basic tool for preparing and analyzing well defined surfaces in UHV environment. Author.
- Nuclear Physics and Elementary Particle Physics