Reliability Studies of Ceramic Capacitors.
Progress rept. 1 Jul 83-1 Oct 84,
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The major objective of our research program is to determine the mechanisms which induce intrinsic and extrinsic failure of ceramic capacitors. Towards this end we are making extensive electrical measurements and microstructural evaluations on both commercial and laboratory-prepared specimens. The measurements being performed include 1 Current as a function of time, temperature, and applied field to evaluate both low and high voltage degradation. 2 Destructive microstructural evaluations. 3 Thermally stimulated polarizationdepolarization current TSPCDC measurements. This combination of experiments has provided us with a great deal of information concerning degradation phenomena. The report is divided into three sections 1 Low voltage degradation, 2 High voltage degradation, and 3 TSPCDC measurements.
- Electrical and Electronic Equipment