Holographic FLI for Detection of Defects.
Interim rept. 15 Jan -1 Jul 84,
HONEYWELL ELECTRO-OPTICS DIV LEXINGTON MA
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In this interim report, we show that the two-exposure FLI Frinze linearization interferometry holographic method is feasible. We describe the series of experiments and mathematical modeling which led to the development of a new test plate fixture, and the introduction of the four-exposure Moire method. We describe how the original two-exposure FLI technique can be utilized by increasing the linear fringe frequency. We describe a two wavelength method for the four-exposure. FLI Moire method which leads to a desensitization. The feasibility of an automatic readout for the linear fringe method is demonstrated by showing that observable and measurable effects at the defect site can be monitored. Finally, we outline the remaining program.