Accession Number:

ADA148203

Title:

Characterization of III-V Compound Semiconductor Device Materials.

Descriptive Note:

Final rept. Oct 79-Oct 83,

Corporate Author:

AIR FORCE WRIGHT AERONAUTICAL LABS WRIGHT-PATTERSON AFB OH

Personal Author(s):

Report Date:

1984-05-01

Pagination or Media Count:

41.0

Abstract:

The objective of this task has been the electrical, optical, and magneto-optical characterization of the intrinsic and extrinsic properties of compound semi-conductors, primarily from the III-V group of materials. Photoluminescent techniques were used to identify both the intrinsic and extrinsic properties of the materials. Intrinsic properties such as energy band gaps, effective mass parameters, refractive indices, dielectric functions, exciton binding energies, and lattice vibration frequencies were determined. Extrinsic properties including activation energies of foreign impurities, binding energy of excitons to foreign impurities and the energies of complexes were established. Transport measurements were used to measure carrier mobilities and electrical conductivity as well as carrier concentrations. These measurements as a function of temperature make it possible to determine the number of donors and the number of acceptors and therefore the compensation ratio in the material. Local vibrational mode spectroscopy was used as a characterization tool to identify specific impurities such as C and Si in GaAs. From the vibrational energy the site location of the impurity can be determined. These characterization techniques have been very successful in evaluating the quality of materials and have been very helpful to the crystal growing programs which has been successful in growing very high quality materials.

Subject Categories:

  • Electricity and Magnetism
  • Optics
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE