Test Procedures and Design Methods for Reliable Large Scale Integrated Circuits and Systems.
Final rept. 9 Jan 82-31 Aug 83,
IOWA UNIV IOWA CITY DIV OF INFORMATION ENGINEERING
Pagination or Media Count:
The following four major problem areas were investigated in the course of the research supported 1 procedures to detect faults in random access memories 2 analysis and design of fault-tolerant computing networks 3 design of testable microprocessors and iterative logic arrays and 4 design and analysis of fault-tolerant connection networks. Author
- Computer Hardware
- Computer Systems