Accession Number:

ADA143324

Title:

Test Procedures and Design Methods for Reliable Large Scale Integrated Circuits and Systems.

Descriptive Note:

Final rept. 9 Jan 82-31 Aug 83,

Corporate Author:

IOWA UNIV IOWA CITY DIV OF INFORMATION ENGINEERING

Personal Author(s):

Report Date:

1984-01-01

Pagination or Media Count:

7.0

Abstract:

The following four major problem areas were investigated in the course of the research supported 1 procedures to detect faults in random access memories 2 analysis and design of fault-tolerant computing networks 3 design of testable microprocessors and iterative logic arrays and 4 design and analysis of fault-tolerant connection networks. Author

Subject Categories:

  • Computer Hardware
  • Computer Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE