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International Conference on Ion Beam Analysis (6th) Held at Tempe, Arizona on 23-27 May 83.
Final rept. 16 Nov 82-15 Nov 83,
ARIZONA STATE UNIV TEMPE
Pagination or Media Count:
Partial Contents Accelerator-based techniques and equipment Rutherford backscattering and channeling analysis Elastic recoil detection Nuclear reaction analysis MeV microbeam and PIXE Low energy ion scattering spectroscopy Secondary ion mass spectrometry Sub-micron ion beams and applications Application of ion beam analysis in materials science, geoscience, archaeology and biology Ion beam analysis of defects and Sputtering and desorption phenomena.
APPROVED FOR PUBLIC RELEASE