Accession Number:

ADA141656

Title:

Auger Depth Profiling Studies of Interdiffusion and Chemical Trapping at Metal-InP Interfaces,

Descriptive Note:

Corporate Author:

XEROX WEBSTER RESEARCH CENTER NY

Personal Author(s):

• Shapira, Y.
• Brillson, L. J.

Report Date:

1983-09-01

Pagination or Media Count:

5.0

Abstract:

Descriptors:

• *DIFFUSION
• *INDIUM PHOSPHIDES
• *METALS
• *SEMICONDUCTORS
• *SURFACE REACTIONS
• AUGER ELECTRON SPECTROSCOPY
• CHEMICAL COMPOSITION
• EMISSION SPECTROSCOPY
• REPRINTS
• SCHOTTKY BARRIER DEVICES
• SOFT X RAYS
• SPUTTERING
• TRAPPING(CHARGED PARTICLES)

Subject Categories:

• Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE