Accession Number:

ADA141050

Title:

Intrinsic Mechanisms of Multi-Layer Ceramic Capacitor Failure.

Descriptive Note:

Annual rept. 15 Mar 83-14 Mar 84,

Corporate Author:

VIRGINIA POLYTECHNIC INST AND STATE UNIV BLACKSBURG

Personal Author(s):

Report Date:

1984-04-01

Pagination or Media Count:

77.0

Abstract:

The major objective of this research is to obtain an improved understanding of degradation mechanisms of MLC capacitors. This is being approached from several directions a Capacitors mainly Z5U and X7R types that are new or in various degrees of degradation as judged by insulation resistance have been cross sectioned for SEM and optical examination, and for compositional measurements using energy dispersive x-ray analysis EDAX, Auger electron spectroscopy AES, and electron beam microprobe. b Electrical measurements on similar devices include current-voltage, current-temperature and impedance-frequency. c Thermoelectric measurements have been made on non-electroded X7R chips in order to separate the carrier concentration from the drift mobility, and to observe their change following reduction of the ceramic.

Subject Categories:

  • Electrical and Electronic Equipment
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE