Development of a 3-D Microscale Topography System, Phase II.
Final technical rept.,
SKF TECHNOLOGY SERVICES KING OF PRUSSIA PA
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This report describes the technical work accomplished in the second phase of a program to develop an automated, three-dimensional, quantitative surface topography measurement system using a stereo-pair of scanning electron microscope SEM micrographs. The system embodies the disciplines of stereo-microscopy and stereo-photogrammetry. The first phase of the program ONR Contract N00014-79-C-0792 explored the technical feasibility of making quantitative three-dimensional measurements of surface topography using a stereo-pair of SEM micrographs. The objectives of the second phase of the program ONR Contract N00014-80-C-0937 were to develop the hardware and software necessary to implement the surface topography measurement system.
- Metallurgy and Metallography