Army Digital Test Requirements Analytic Report.
Final rept. Oct 82-Jul 83,
MANTECH INTERNATIONAL CORP ALEXANDRIA VA
Pagination or Media Count:
During the past decade, both the capabilities and technology of Army electronic equipment have rapidly advanced with the advent of microprocessor-based systems and complex VLSI chips. The testing of these existing microprocessor-based systemsboards is presently straining the existing Army ATE assets in that expensive interface adaptors must be used for testing the microprocessor bidirectional data bus. Also, the digital pattern rate is at or above the upper limit of Army ATE and excessive test times are required because of limited bit pattern depth in existing Army ATE. This report deals with an analytic approach taken to identify the analysis of the Army digital test requirements of the next 5-8 years 1988-1991. An envelope of digital technology parameters was developed after an analysis of data extracted from ten military systems, six commercial systems, trade journals, conferences, technical manuals and ATE industry surveys. The report also addresses the premises that will be used to identify ATE requirements for the maintenance support of the present and future Army equipment. These premises will be used as a basis to generate a second report on ATE test requirements. Author
- Electrical and Electronic Equipment
- Test Facilities, Equipment and Methods