Basic Mechanisms of Radiation Effects on Electronic Materials, Devices, and Integrated Circuits
NORTHROP RESEARCH AND TECHNOLOGY CENTERPALOS VERDES PENINSULA CA
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This report describes in a tutorial manner the basic mechanism of radiation effects on electronic materials, devices, and integrated circuits. Radiation effects in bulk silicon and in silicon devices are treated. Ionizing radiation effects in silicon dioxide films and silicon MOS devices are discussed. Single event phenomena are considered. Key literature references and a bibliography are provided.
- Electrical and Electronic Equipment