Accession Number:

ADA136310

Title:

X-Ray Topographic Measurements of Strain Fields.

Descriptive Note:

Technical rept.,

Corporate Author:

ILLINOIS UNIV AT URBANA DEPT OF METALLURGY AND MINING ENGINEERING

Personal Author(s):

Report Date:

1983-08-01

Pagination or Media Count:

11.0

Abstract:

This report describes a new technique which allows the determination of strain components in solids with a spatial resolution of about 10 micrometers. The method uses x-ray topography and may be applied to specimens which have relatively high dislocation contents. The technique may be used for thin specimens as well as relatively thick ones. Author

Subject Categories:

  • Test Facilities, Equipment and Methods
  • Crystallography

Distribution Statement:

APPROVED FOR PUBLIC RELEASE