X-Ray Topographic Measurements of Strain Fields.
ILLINOIS UNIV AT URBANA DEPT OF METALLURGY AND MINING ENGINEERING
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This report describes a new technique which allows the determination of strain components in solids with a spatial resolution of about 10 micrometers. The method uses x-ray topography and may be applied to specimens which have relatively high dislocation contents. The technique may be used for thin specimens as well as relatively thick ones. Author
- Test Facilities, Equipment and Methods