Symposium on Advanced Methods of Catalyst Characterization, November 1-2, 1982.
LEHIGH UNIV BETHLEHEM PA
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The objective of the symposium was to present, discuss, and evaluate the most advanced state-of-the-art methods that can be used for the characterization of heterogeneous catalysts down to atomic and molecular level. The 30 presented papers covered applications of very high resolution transmission TEM and scanning transmission STEM electron microscopy, in situ TEM studies, and high resolution analytical STEM characterization and preparation of metal clusters and encapsulation of small particles spectroscopic studies of catalysts and their surfaces, particularly solid state spin-echo and magic angle spinning NMR, Fourier transform infrared, including beam deflection spectroscopy, EXAFS, SIMS, ISS, and Mossbauer spectroscopic investigations. The Symposium program and abstracts are attached in Appendix I. Fifteen full papers will appear, along with the abstracts, in a late 1983 issue of the Journal of Molecular Catalysis. The Symposium was international in scope, with six foreign speakers from the United Kingdom, Netherlands, and Mexico.
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- Atomic and Molecular Physics and Spectroscopy