Thermal Diffusivity in Thin Films Measured by Noncontact Single-Ended Pulsed-Laser-Induced Thermal Radiometry.
IBM RESEARCH LAB SAN JOSE CA
Pagination or Media Count:
A pulsed nitrogen laser is used to induce a sharp thermal gradient in a thin film, and the thermal radiation infrared transient from the irradiated region is monitored from the same side as the excitation beam ie.e, single-ended detection. We show that this pulsed photothermal radiometry lineshape can be analyzed to provide the thermal diffusivity or thickness of the sample, as well as information on subsurface modifications or the degree of thermal contact with a substrate. We present data for several important classes of films, including metal, polymer and paper e.g., in currency and show the important features of the present technique for thin-film characterization, namely nondestructive, fast and remote sensing. Author
- Solid State Physics