Analysis and Testing of Radiation-Induced Transient Effects in Complex Microcircuits
Topical rept. 28 Jan 1980-1 Jun 1982
MISSION RESEARCH CORP SAN DIEGO CA
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Analytical and experimental considerations in assessing transient effects of microcircuits exposed to a pulsed radiation environment are summarized tutorially with extensive references. The report represented the notes associated with lectures given at the 1981 and 1982 IEEE Radiation Effects Conference Short Course.
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