Accession Number:

ADA135814

Title:

Analysis and Testing of Radiation-Induced Transient Effects in Complex Microcircuits

Descriptive Note:

Topical rept. 28 Jan 1980-1 Jun 1982

Corporate Author:

MISSION RESEARCH CORP SAN DIEGO CA

Personal Author(s):

Report Date:

1982-06-01

Pagination or Media Count:

131.0

Abstract:

Analytical and experimental considerations in assessing transient effects of microcircuits exposed to a pulsed radiation environment are summarized tutorially with extensive references. The report represented the notes associated with lectures given at the 1981 and 1982 IEEE Radiation Effects Conference Short Course.

Subject Categories:

  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE